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Biased Highly Accelerated Stress Test (BHAST) BHAST
Accelerates the simulation of moisture ingress into the package under humid conditions, providing faster results than conventional testing.
Test Description

AEC-Q101/JESD22A-110/IEC60749-4/GB/T

4973.4-2012/MIL-STD-883 Method 1038/GJB548 Method 1008

Test Objective

Weaknesses in the chip passivation structure or topology, as well as in edge sealing, are affected differently under humidity and electrical bias. Contaminants may also be transported by moisture into critical regions, potentially leading to failure.

Testing Equipment & Instruments