Laboratory
and supported by an experienced technical team.
Environmental reliability testing equipment precisely controls temperature and humidity inside a chamber using high-accuracy cooling/heating and humidity systems to simulate the harsh conditions products may face in real-world environments. The goal is to assess durability, adaptability, and reliability, by accelerating life-cycle stresses in the lab to uncover design defects, detect early failures, and validate product life expectancy.
Suitable for aerospace products, electronic components, electrical/electronic devices, and materials that require performance tests under rapid temperature transitions.
Lifespan aging reliability testing equipment simulates and intensifies the environmental and operating stresses that products endure in real use within a laboratory, through accelerated aging processes, to quantitatively assess product life and long-term reliability as an integrated test system. It combines “environmental stress simulation” with “time-accumulated effects,” with the objective of predicting performance degradation and failure mechanisms after long-term use in a short period.
Its operation is based on Accelerated Life Testing (ALT) models, applying enhanced combined stresses to “compress” time while continuously monitoring key performance parameters.
This equipment goes beyond single-stress testing by revealing product life bottlenecks through comprehensive acceleration methods.
Semiconductor Power Device and Module Testing System The semiconductor power device and module testing system is a highly specialized, highly integrated platform designed to comprehensively evaluate power semiconductors (e.g., IGBT, SiC MOSFET, GaN HEMT) in conditions approaching or exceeding real operating limits. It addresses the unique challenges of high voltage isolation, EMI, and advanced thermal management that arise from high-voltage, high-current, and high-frequency switching. In simple terms, this system is not merely a "measurement tool" but a platform for stress-testing device limits and a "lifespan predictor." The system can conduct a full range of tests—from basic to cutting-edge, static to dynamic, and ambient to high temperature.
